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| mic2550abml资料 | |
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mic2550abml |
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file size : 116 kb
manufacturer: description:notes: 9. test conditions assume signal transition time of 3 ns or less, timing reference levels of vcc(typ.)/2, input pulse levels of 0 to vcc(typ.), and output loading of the specified iol. 10. at any given temperature and voltage condition, thzce is less than tlzce, thzbe is less than tlzbe, thzoe is less than t. 11. if both byte enables are toggled together, this value is 10 ns. 12. thzoe, thzce, thzbe, and thzwe transitions are measured when the outputs enter a high-impedance state. 13. the internal write time of the memory is defined by the overlap of we, ce1 = vil, bhe and/or ble = vil. 14. device is continuously selected. oe, ce1 = vil, bhe and/or ble = vil, ce2 = vih. 15. we is high for read cycle. |
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| 1pcs | 100pcs | 1k | 10k | ||
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型 号：mic2550abml 厂 家： 封 装：0628 批 号： 数 量：6985 说 明： |
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运 费： 所在地： 新旧程度： |
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| 联系人：林浩/林妮 |
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